Mixed-mode Bist Based on Column Matching
نویسندگان
چکیده
A test-per-clock BIST method for combinational or full-scan circuits is proposed. The method is based on a design of a combinational block the decoder, transforming pseudo-random LFSR code words into deterministic test patterns. A Column-Matching algorithm to design the decoder is proposed. The Column-Matching method modified to support a mixed-mode BIST is proposed as well. Here the BIST is divided into two disjoint phases – the pseudo-random phase, where the LFSR patterns are being applied to the circuit unmodified, and the deterministic phase detecting all the yet undetected faults. This enables us to reach a high fault coverage in a short test time and with a low area overhead.
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تاریخ انتشار 2004